Patent attributes
A test device configured to test a photonic integrated circuit (IC) is provided. The photonic IC includes at least one waveguide edge coupler, and the test device includes an optical coupler. The optical coupler is configured to be optically aligned with the photonic IC, and includes at least one focusing lens and a first reflector. The at least one focusing lens is aligned with the at least one waveguide edge coupler. A light from the waveguide edge coupler is focused by the focusing lens, reflected by the first reflector, and transmitted to a fiber connector in sequence, or a light from the fiber connector is reflected by the first reflector and focused onto the waveguide edge coupler by the focusing lens in sequence. A heterogeneously integrated structure is also provided.
