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US Patent 11002787 Scalable platform for system level testing

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
0
Date Filed
March 6, 2018
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Date of Patent
May 11, 2021
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Patent Application Number
15913673
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Patent Citations Received
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US Patent 12007411 Test socket having an automated lid
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US Patent 11754596 Test site configuration in an automated test system
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US Patent 11754622 Thermal control system for an automated test system
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US Patent 11867749 Vision system for an automated test system
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US Patent 11953519 Modular automated test system
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Patent Inventor Names
Ben Rogel-Favila
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Mei-Mei Su
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Roland Wolff
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
11002787
0
Patent Primary Examiner
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Farhana A Hoque
0

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