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US Patent 10977814 System and method for specular surface inspection

Patent 10977814 was granted and assigned to Sightline Innovation Inc. on April, 2021 by the United States Patent and Trademark Office.

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Patent abstractTimelineTable: Further ResourcesReferences
Is a
Patent
Patent

Patent attributes

Patent Applicant
Sightline Innovation Inc.
Sightline Innovation Inc.
Current Assignee
Sightline Innovation Inc.
Sightline Innovation Inc.
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
10977814
Patent Inventor Names
Wallace Trenholm1
Jason Cassidy1
Maithili Mavinkurve1
Mark Alexiuk1
Date of Patent
April 13, 2021
Patent Application Number
16239637
Date Filed
January 4, 2019
Patent Primary Examiner
‌
Brian Werner
Patent abstract

Embodiments described herein relate to systems and methods for specular surface inspection, and particularly to systems and methods for surface inspection comprising inverse synthetic aperture imaging (“ISAI”) and specular surface geometry imaging (“SSGI”). Embodiments may allow an object under inspection, to be observed, imaged and processed while continuing to be in motion. Further, multiple optical input sources may be provided, such that the object does not have to be in full view of all optical sensors at once. Further, multi-stage surface inspection may be provided, wherein an object under inspection may be inspected at multiple stages of an inspection system, such as, for an automotive painting process, inspection at primer, inspection at paint, inspection at final assembly. SSGI imaging modules are also described for carrying out micro-deflectometry.

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