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US Patent 10955466 Environment control apparatus

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
0
Date Filed
January 2, 2020
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Date of Patent
March 23, 2021
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Patent Application Number
16733204
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Patent Citations Received
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US Patent 11940487 Thermal solution for massively parallel testing
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US Patent 11549981 Thermal solution for massively parallel testing
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US Patent 11567119 Testing system including active thermal interposer device
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US Patent 11573262 Multi-input multi-zone thermal control for device testing
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US Patent 11774492 Test system including active thermal interposer device
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US Patent 11841392 Integrated test cell using active thermal interposer (ATI) with parallel socket actuation
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US Patent 11852678 Multi-input multi-zone thermal control for device testing
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US Patent 11940478 Electronic device characterization systems and methods
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US Patent 11493551 Integrated test cell using active thermal interposer (ATI) with parallel socket actuation
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US Patent 11587640 Carrier based high volume system level testing of devices with pop structures
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•••
Patent Inventor Names
Chen-Lung Tsai
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Gene Rosenthal
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
10955466
0
Patent Primary Examiner
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Dominic E Hawkins
0

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