Patent attributes
An apparatus for testing electromagnetic components includes electromagnetically-isolating external walls that define a chamber. An internal wall is attached to one or more of the electromagnetically-isolating external walls to form an internal test instrument chamber and an internal device testing chamber. An internal RF feed-through port passes through the internal wall to electrically couple a test instrument disposed in the internal test instrument chamber to a wireless device-under-test (DUT) disposed in the internal device testing chamber. One or more external RF feed-through ports can pass through one of the electromagnetically-isolating external walls to electrically couple the DUT and/or the test instrument to a second wireless device.
