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US Patent 10879031 Apparatus of plural charged-particle beams

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Patent Citations Received
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US Patent 12119204 Particle beam system and the use thereof for flexibly setting the current intensity of individual particle beams
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US Patent 12094683 Method for operating a multi-beam particle beam microscope
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US Patent 11935721 System comprising a multi-beam particle microscope and method for operating the same
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edited on 24 May, 2023
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US Patent 11657999 Particle beam system and method for the particle-optical examination of an object
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edited on 23 May, 2023
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Official Website
https://pdfpiw.uspto.gov/.piw?Docid=108790310
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US Patent 11562881 Charged particle beam system
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edited on 25 Jan, 2023
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US Patent 11562880 Particle beam system for adjusting the current of individual particle beams
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US Patent 11521827 Method of imaging a 2D sample with a multi-beam particle microscope
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Infobox
Is a
Patent
Patent
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
108790310
Date of Patent
December 29, 2020
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Patent Application Number
165516550
Date Filed
August 26, 2019
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Official Website
https://pdfpiw.uspto.gov/.piw?Docid=108790310
Patent Citations
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US Patent 10395886 Apparatus of plural charged-particle beams
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Patent Primary Examiner
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David E Smith
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Edits on 17 Jun, 2022
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Website URL
https://pdfpiw.uspto.gov/.piw?Docid=10879031
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 US Patent 10879031 Apparatus of plural charged-particle beams

Infobox
Is a
Patent
Patent
Patent jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent number
10879031
Date of patent
December 29, 2020
Patent application number
16551655
Date Filed
August 26, 2019
Patent citations
‌
US Patent 10395886 Apparatus of plural charged-particle beams
Patent primary examiner
‌
David E Smith

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