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US Patent 10775408 System for testing devices inside of carriers

Patent 10775408 was granted and assigned to Teradyne on September, 2020 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
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Current Assignee
Teradyne
Teradyne
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Date Filed
August 20, 2018
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Date of Patent
September 15, 2020
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Patent Applicant
Teradyne
Teradyne
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Patent Application Number
16105179
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Patent Citations Received
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US Patent 11940487 Thermal solution for massively parallel testing
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US Patent 11549981 Thermal solution for massively parallel testing
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US Patent 11841392 Integrated test cell using active thermal interposer (ATI) with parallel socket actuation
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US Patent 11852678 Multi-input multi-zone thermal control for device testing
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US Patent 11493551 Integrated test cell using active thermal interposer (ATI) with parallel socket actuation
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US Patent 11567119 Testing system including active thermal interposer device
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US Patent 11573262 Multi-input multi-zone thermal control for device testing
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US Patent 11587640 Carrier based high volume system level testing of devices with pop structures
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US Patent 11609266 Active thermal interposer device
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US Patent 11656273 High current device testing apparatus and systems
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•••
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
10775408
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Patent Primary Examiner
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Vinh P Nguyen
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