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US Patent 10653376 X-ray imaging system

Patent 10653376 was granted and assigned to Sigray, Inc. on May, 2020 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
Current Assignee
Sigray, Inc.
Sigray, Inc.
Date Filed
May 3, 2019
Date of Patent
May 19, 2020
Patent Applicant
Sigray, Inc.
Sigray, Inc.
Patent Application Number
16402887
Patent Citations
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US Patent 10074451 X-ray interferometer
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US Patent 10014148 Electron source, X-ray source and device using the X-ray source
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US Patent 10020158 Transmitting-type target and X-ray generation tube provided with transmitting-type target
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US Patent 10028716 Differential phase-contrast imaging
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US Patent 10045753 Structure, method for manufacturing the same, and talbot interferometer
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US Patent 10068740 Distributed, field emission-based X-ray source for phase contrast imaging
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US Patent 10269528 Diverging X-ray sources using linear accumulation
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US Patent 10295485 X-ray transmission spectrometer system
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US Patent 10295486 Detector for X-rays with high spatial and high spectral resolution
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US Patent 10297359 X-ray illumination system with multiple target microstructures
•••
Patent Citations Received
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US Patent 10976273 X-ray spectrometer system
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US Patent 10989822 Wavelength dispersive x-ray spectrometer
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US Patent RE48612 X-ray interferometric imaging system
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US Patent 11056308 System and method for depth-selectable x-ray analysis
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US Patent 11686692 High throughput 3D x-ray imaging system using a transmission x-ray source
0
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US Patent 11428651 System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements
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US Patent 11885755 X-ray sequential array wavelength dispersive spectrometer
0
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US Patent 11992350 System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector
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US Patent 11549895 System and method using x-rays for depth-resolving metrology and analysis
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
10653376
Patent Primary Examiner
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Allen C. Ho

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