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US Patent 10648800 System and process for roof measurement using imagery

Patent 10648800 was granted and assigned to Pictometry International Corp. on May, 2020 by the United States Patent and Trademark Office.

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US Patent 12136127 System and method for property condition analysis
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US Patent 11967097 System and method for change analysis
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US Patent 11887364 Systems and methods for mapping project sites using ground and aerial imagery
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US Patent 11875413 System and method for property condition analysis
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US Patent 11861843 System and method for object analysis
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Official Website
https://pdfpiw.uspto.gov/.piw?Docid=106488000
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US Patent 11640667 Method for property feature segmentation
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US Patent 11568639 Systems and methods for analyzing remote sensing imagery
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Infobox
Is a
Patent
Patent
0
Patent Applicant
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Pictometry International Corp.
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Current Assignee
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Pictometry International Corp.
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
106488000
Date of Patent
May 12, 2020
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Patent Application Number
162653380
Date Filed
February 1, 2019
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Official Website
https://pdfpiw.uspto.gov/.piw?Docid=106488000
Patent Citations Received
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US Patent 11367265 Method and system for automated debris detection
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Patent Primary Examiner
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Atiba O Fitzpatrick
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Edits on 22 Jun, 2022
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Patent citations received
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US Patent 11367265 Method and system for automated debris detection
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Website URL
https://pdfpiw.uspto.gov/.piw?Docid=10648800
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 US Patent 10648800 System and process for roof measurement using imagery

Infobox
Is a
Patent
Patent
Patent applicant
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Pictometry International Corp.
Current assignee
‌
Pictometry International Corp.
Patent jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent number
10648800
Date of patent
May 12, 2020
Patent application number
16265338
Date Filed
February 1, 2019
Patent primary examiner
‌
Atiba O Fitzpatrick

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