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US Patent 10503632 Impact analysis for software testing

Patent 10503632 was granted and assigned to Amazon on December, 2019 by the United States Patent and Trademark Office.

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Contents

Is a
Patent
Patent
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Patent attributes

Patent Applicant
Amazon
Amazon
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Current Assignee
Amazon
Amazon
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
105036320
Patent Inventor Names
Sudhakar Sivanantham0
Aaron Tang0
Shweta Pednekar0
Date of Patent
December 10, 2019
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Patent Application Number
161466480
Date Filed
September 28, 2018
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Patent Citations
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US Patent 10303587 System and method for generating regression test suite
Patent Citations Received
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US Patent 12001818 Extensible IDE platform with open APIs
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US Patent 11681502 Industrial automation domain-specific language programming paradigm
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US Patent 11308447 Cloud-based collaborative industrial automation design environment
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US Patent 11392112 Virtual design environment
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US Patent 11940901 System and method to use past computer executable instructions to evaluate proposed computer executable instructions
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US Patent 11966930 Computing tool risk discovery
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US Patent 11481313 Testing framework for automation objects
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US Patent 11531536 Analyzing performance impacts of source code changes
...
Patent Primary Examiner
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Philip Wang
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Patent abstract

Devices and methods are provided for providing software developer-driven analysis for the expected impact that a proposed software modification may have on software programs and devices. A device may receive files including a first file including indications of: (i) a feature modified by one or more software modifications, (ii) a sub-feature associated with the feature and modified by the one or more software modifications, and (iii) first information associated with the feature, and a second file including indications of: (i) the feature, (ii) the sub-feature, and (iii) second information associated with the feature. The device may determine a record including indications of: (i) the feature, (ii) the sub-feature, (iii) the first information, and (iv) the second information. The device may determine a test plan including one or more tests performed based on the record. The device may execute at least a portion of the test plan.

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