Patent attributes
Disclosed is a socket device for testing an IC, the socket device including: a base on which an integrated circuit (IC) is mounted; a contact module having multiple contacts; a floating hinge block elastically supported on a side of the base in a vertical direction; a lid configured to rotate with the floating hinge block and having a pressing portion on a bottom surface thereof; a floating latch elastically supported on a side of the base to be parallel to the floating hinge block such that the lid is fixed; a first camshaft installed by penetrating the base and the floating hinge block and adjusting a height of the floating hinge block; a second camshaft installed by penetrating the base and the floating latch and adjusting a height of the floating latch; a lever; a handle; and a link connected to the lever and the handle respectively to rotate independently.
