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US Patent 10402676 Automated system and methodology for feature extraction

Patent 10402676 was granted and assigned to Pictometry International Corp. on September, 2019 by the United States Patent and Trademark Office.

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Contents

Is a
Patent
Patent

Patent attributes

Patent Applicant
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Pictometry International Corp.
Current Assignee
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Pictometry International Corp.
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
10402676
Date of Patent
September 3, 2019
Patent Application Number
15428860
Date Filed
February 9, 2017
Patent Citations Received
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US Patent 12136127 System and method for property condition analysis
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US Patent 11978227 Systems and methods for forest surveying
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US Patent 11983813 Method and system for determining solar access of a structure
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0
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US Patent 10521694 3D building extraction apparatus, method and system
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US Patent 10529029 Platform, systems, and methods for identifying property characteristics and property feature maintenance through aerial imagery analysis
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US Patent 10650285 Platform, systems, and methods for identifying property characteristics and property feature conditions through aerial imagery analysis
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US Patent 11551413 Method and system for determining solar access of a structure
...
Patent Primary Examiner
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Ali Bayat
Patent abstract

An automated method performed by at least one processor running computer executable instructions stored on at least one non-transitory computer readable medium, comprising: classifying first data points identifying at least one man-made roof structure within a point cloud and classifying second data points associated with at least one of natural structures and ground surface to form a modified point cloud; identifying at least one feature of the man-made roof structure in the modified point cloud; and generating a roof report including the at least one feature.

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