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US Patent 10401309 X-ray techniques using structured illumination

Patent 10401309 was granted and assigned to Sigray, Inc. on September, 2019 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
Current Assignee
Sigray, Inc.
Sigray, Inc.
Date Filed
June 5, 2016
Date of Patent
September 3, 2019
Patent Applicant
Sigray, Inc.
Sigray, Inc.
Patent Application Number
15173711
Patent Citations
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US Patent 10085701 Medical image system and joint cartilage state score determination method
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US Patent 10141081 Phase contrast X-ray imaging device and phase grating therefor
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US Patent 10151713 X-ray reflectometry apparatus for samples with a miniscule measurement area and a thickness in nanometers and method thereof
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US Patent 10153062 Illumination and imaging device for high-resolution X-ray microscopy with high photon energy
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US Patent 10182194 Method and apparatus for improved detective quantum efficiency in an X-ray detector
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US Patent 10176297 Hospital bed computer system having EMR charting capability
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US Patent 10014148 Electron source, X-ray source and device using the X-ray source
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US Patent 10028716 Differential phase-contrast imaging
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US Patent 10045753 Structure, method for manufacturing the same, and talbot interferometer
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US Patent 10068740 Distributed, field emission-based X-ray source for phase contrast imaging
•••
Patent Citations Received
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US Patent 11992350 System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector
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US Patent 11357458 High-contrast, convergent x-ray imaging with laser-Compton sources
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US Patent 11428651 System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements
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US Patent 11885755 X-ray sequential array wavelength dispersive spectrometer
0
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US Patent 10653376 X-ray imaging system
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US Patent 10656105 Talbot-lau x-ray source and interferometric system
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US Patent 11549895 System and method using x-rays for depth-resolving metrology and analysis
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US Patent 10721082 Screen printed phosphors for intrinsic chip identifiers
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US Patent 10845491 Energy-resolving x-ray detection system
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US Patent 10962491 System and method for x-ray fluorescence with filtering
•••
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
10401309
Patent Primary Examiner
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Don K Wong

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