US Patent 10382048 Calibration of analog-to-digital converter devices

Disclosed herein are systems for calibrating an analog-to-digital converter (ADC) device, as well as related devices and methods. In some embodiments, a system for calibrating an ADC device may include an ADC device, wherein the ADC device includes an ADC and a dither source, and wherein the ADC device is to apply a set of calibration parameters to generate digital outputs. The system may also include calibration circuitry, coupled to the ADC device, to determine which of multiple sets of values of calibration parameters results in the digital outputs having the lowest amount of noise, and to cause the ADC device to apply the calibration parameters associated with the lowest noise.