US Patent 10346282 Multi-data analysis based proactive defect detection and resolution

Multi-data analysis based proactive defect detection and resolution may include analyzing operational data for an application to determine whether a functionality related to the application is below a predetermined threshold associated with the functionality related to the application, and based on the analysis, generating an indication to perform defect analysis related to the functionality related to the application. A sentiment analysis may be performed on consumer data related to the application to determine a sentiment of the consumer data related to the application, and a natural language processing (NLP) analysis may be performed on the consumer data related to the application to determine a function associated with a negative sentiment. Application code and process data related to the application may be analyzed to determine a defect associated with the application. Further, a code of the application may be modified to correct the defect associated with the application.