US Patent 10338993 Analysis of failures in combinatorial test suite

The computing device generates a test suite that provides test cases for testing a system. A test condition in the test suite comprises one of different levels representing different options assigned to a categorical factor for the system. The computing device receives input weights for one or more levels of the test suite. The computing device receives a failure indication indicating a test conducted according to the test cases failed. The computing device determines a plurality of cause indicators based on the input weights and any commonalities between test conditions of any failed test cases of the test suite that resulted in a respective failed test outcome. The computing device identifies, based on comparing the plurality of cause indicators, a most likely potential cause for a potential failure of the system. The computing device outputs an indication of the most likely potential cause for the potential failure of the system.