US Patent 10333631 Test arrangement and test method

The present invention provides to a test arrangement and a test method for testing a device under test. In particular, a test arrangement is provided com-prising a device for vectorial analysis of measurement signals and at least one further device for analyzing only the power of radio frequency signals related to the de-vice under test. By simultaneously operating the device for vectorial analysis and the device for analyzing the power, an efficient testing can be achieved.