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US Patent 10247545 Laser gauge for robotic calibration and monitoring

Patent 10247545 was granted and assigned to Think Surgical on April, 2019 by the United States Patent and Trademark Office.

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Is a
Patent
Patent

Patent attributes

Patent Applicant
Think Surgical
Think Surgical
Current Assignee
Think Surgical
Think Surgical
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
10247545
Date of Patent
April 2, 2019
Patent Application Number
15549485
Date Filed
February 12, 2016
Patent Citations Received
0
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US Patent 11986165 Co-manipulation surgical system for use with surgical instruments for performing laparoscopic surgery while estimating hold force
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US Patent 12011149 Co-manipulation surgical system for bedside robotic laparoscopic surgery using surgical instruments
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US Patent 11504197 Co-manipulation surgical system having multiple operational modes for use with surgical instruments for performing laparoscopic surgery
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US Patent 10667868 System and methods for performing surgery on a patient at a target site defined by a virtual object
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US Patent 11622826 Co-manipulation surgical system for use with surgical instruments for performing laparoscopic surgery while compensating for external forces
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US Patent 11786323 Self-calibrating co-manipulation surgical system for use with surgical instrument for performing laparoscopic surgery
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US Patent 11832909 Co-manipulation surgical system having actuatable setup joints
0
...
Patent Primary Examiner
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Sunghee Y Gray
Patent abstract

A contactless, and accurate device and methods of use thereof are provided to calibrate and verify the calibration of a robotic arm and associated attachments. The device uses a laser gauge for calibrating and subsequently verifying the calibration of the robotic arm, digitizer, or robotic tools. An optical transmitter, in communication with an optical receiver is fixed nearly perpendicular to a second optical transmitter in communication with a second optical receiver that form two optical micrometers that are offset a small distance, forming a small gap, d, to create a measuring void having two distinct non-intersecting measurement planes. One measurement plane measures the position and size of an object in a first axis direction and the other measurement plane measures the position and size of an object in a second axis direction. The position and size of an object is measured within the measuring void in both axial directions.

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