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US Patent 10176966 Edge detection system

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
0
Date Filed
February 8, 2018
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Date of Patent
January 8, 2019
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Patent Application Number
15892080
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Patent Citations Received
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US Patent 11996265 System and method for generating and analyzing roughness measurements and their use for process monitoring and control
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US Patent 11355306 System and method for generating and analyzing roughness measurements and their use for process monitoring and control
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US Patent 11361937 System and method for generating and analyzing roughness measurements and their use for process monitoring and control
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US Patent 11380516 System and method for generating and analyzing roughness measurements and their use for process monitoring and control
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US Patent 11508546 System and method for low-noise edge detection and its use for process monitoring and control
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US Patent 11521825 System and method for predicting stochastic-aware process window and yield and their use for process monitoring and control
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US Patent 10488188 System and method for removing noise from roughness measurements
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US Patent 10510509 Edge detection system
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US Patent 10522322 System and method for generating and analyzing roughness measurements
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US Patent 10648801 System and method for generating and analyzing roughness measurements and their use for process monitoring and control
•••
Patent Inventor Names
Chris Mack
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
10176966
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Patent Primary Examiner
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Nicole Ippolito
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