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US Patent 10176966 Edge detection system

Overview Structured Data Issues Contributors

Is a

1

Date Filed

February 8, 2018

1

Date of Patent

January 8, 2019

1

Patent Application Number

15892080

1

Patent Citations Received

US Patent 11996265 System and method for generating and analyzing roughness measurements and their use for process monitoring and control

2

US Patent 11355306 System and method for generating and analyzing roughness measurements and their use for process monitoring and control

1

US Patent 11361937 System and method for generating and analyzing roughness measurements and their use for process monitoring and control

1

US Patent 11380516 System and method for generating and analyzing roughness measurements and their use for process monitoring and control

US Patent 11508546 System and method for low-noise edge detection and its use for process monitoring and control

US Patent 11521825 System and method for predicting stochastic-aware process window and yield and their use for process monitoring and control

US Patent 10488188 System and method for removing noise from roughness measurements

US Patent 10510509 Edge detection system

US Patent 10522322 System and method for generating and analyzing roughness measurements

US Patent 10648801 System and method for generating and analyzing roughness measurements and their use for process monitoring and control

•••

Patent Inventor Names

Chris Mack

1

Patent Jurisdiction

United States Patent and Trademark Office

1

Patent Number

1

Patent Primary Examiner

Nicole Ippolito

1

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