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US Patent 10157786 Selective formation of metallic films on metallic surfaces

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Patent abstractTimelineTable: Further ResourcesReferences
Is a
Patent
Patent
1

Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
1
Patent Number
101577861
Patent Inventor Names
Antti Niskanen1
Marko Tuominen1
Suvi P. Haukka1
Date of Patent
December 18, 2018
1
Patent Application Number
153563061
Date Filed
November 18, 2016
1
Patent Citations Received
‌
US Patent 11967525 Selective tungsten deposition at low temperatures
2
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US Patent 11501966 Selective layer formation using deposition and removing
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US Patent 11404313 Selective tungsten deposition at low temperatures
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US Patent 11430656 Deposition of oxide thin films
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US Patent 11830732 Selective passivation and selective deposition
9
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US Patent 11446699 Vapor phase deposition of organic films
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US Patent 11908740 Semiconductor structure with doped via plug
11
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US Patent 11501965 Plasma enhanced deposition processes for controlled formation of metal oxide thin films
...
Patent Primary Examiner
‌
Joseph C. Nicely
1
Patent abstract

Metallic layers can be selectively deposited on one surface of a substrate relative to a second surface of the substrate. In some embodiments, the metallic layers are selectively deposited on copper instead of insulating or dielectric materials. In some embodiments, a first precursor forms a layer on the first surface and is subsequently reacted or converted to form a metallic layer. The deposition temperature may be selected such that a selectivity of above about 50% or even about 90% is achieved.

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