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US Patent 10154422 Subband-based modulation tester

Patent 10154422 was granted and assigned to Vayyar on December, 2018 by the United States Patent and Trademark Office.

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Patent
Patent
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Patent attributes

Patent Applicant
Vayyar
Vayyar
0
Current Assignee
Vayyar
Vayyar
0
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
0
Patent Number
101544220
Patent Inventor Names
Naftali Chayat0
Date of Patent
December 11, 2018
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Patent Application Number
152904530
Date Filed
October 11, 2016
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Patent Citations Received
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US Patent 11918330 Home occupant detection and monitoring system
0
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US Patent 10989806 Home occupant detection and monitoring system
Patent Primary Examiner
‌
Kiet Tang
0
Patent abstract

Methods and systems are disclosed which allow testing essential performance parameters of broadband communications systems, while using test channels of lower bandwidth, allowing thus lower cost hardware (or use of legacy test system). In particular, the methods and systems allow testing of EVM in digital systems, especially OFDM systems. The methods and systems readily apply to test equipment for production lines, such as IC testers of final product testers.

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