SBIR/STTR Award attributes
Electron microscopes and optical microscopes – two of the most important tools for most fields of science – offer complementary methods of profiling surface morphologies and chemical processes of microscopic specimens. However, there currently exists no quick, easy way to directly compare or overlay the images and other data provided by these separate instruments. To address this problem, Physical Sciences Inc. (PSI) will develop a high-resolution optical microscopy system that can be installed on many common electron microscopes. This optical system will allow instantaneous overlay of optical and electron microscope images. It will also enable simple, direct comparison of surface morphological and chemical maps obtained using complementary electron and optical instruments. In Phase I, PSI will partner with Los Alamos National Lab (LANL) to demonstrate the efficacy of the new optical and electron microscopy techniques required to seamlessly merge the two types of instrument. LANL – with support from PSI – will focus on advancing 3D electron microscopy, while PSI demonstrates 3D surface mapping can be achieved using optical equipment compatible with an electron microscope. PSI will implement algorithms to automate the analysis of the vast amounts of data generated by the related microscopy techniques. The Phase I program will culminate in a conceptual design for the fully merged prototype instruments to be built and demonstrated in Phase II. The optical devices, microscopy methods and related software developed in this program will result in a third party product for electron microscopes allowing researchers in chemistry, physics, biology and many other fields to increase productivity and generate new, otherwise unobtainable scientific insights.
