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Jack S Chen
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Edits on 14 Dec, 2021
"Remove inverse infobox"
Golden AI
edited on 14 Dec, 2021
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-3
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Infobox
Patent primary examiner of
US Patent 11183433 Method of evaluating silicon layer and a method of manufacturing silicon epitaxial wafer
US Patent 11183581 Vertical field effect transistor having improved uniformity
US Patent 11183635 Method for manufacturing semiconductor device
Edits on 25 Nov, 2021
Golden AI
edited on 25 Nov, 2021
Edits made to:
Infobox
(
+1
properties)
Infobox
Patent primary examiner of
US Patent 11183635 Method for manufacturing semiconductor device
Golden AI
edited on 25 Nov, 2021
Edits made to:
Infobox
(
+1
properties)
Infobox
Patent primary examiner of
US Patent 11183581 Vertical field effect transistor having improved uniformity
Golden AI
edited on 25 Nov, 2021
Edits made to:
Infobox
(
+1
properties)
Infobox
Patent primary examiner of
US Patent 11183433 Method of evaluating silicon layer and a method of manufacturing silicon epitaxial wafer
"Created via: Entity Importer"
Golden AI
created this topic on 25 Nov, 2021
Edits made to:
Infobox
(
+2
properties)
Jack S Chen
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United States Patent and Trademark Office
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