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G01R 31/001

{Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing }

OverviewStructured DataIssuesContributors
Is a
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Patent classification
Child Classification
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G01R 31/002
Classification Type
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Cooperative Patent Classification
Parent Classification
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G01R 31/00
Official Website
data.epo.org/linked-d...01R31-001

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