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G01N 23/2276

Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM] using the Auger effect, e.g. Auger electron spectroscopy [AES]

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Edits on 16 Mar, 2022
"Entity importer update"
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Golden AI
edited on 16 Mar, 2022
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G01N 23/227
Edits on 5 Mar, 2022
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Golden AI
created this topic on 5 Mar, 2022
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 G01N 23/2276

Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM] using the Auger effect, e.g. Auger electron spectroscopy [AES]

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Cooperative Patent Classification
Website
http://data.epo.org/linked-data/def/cpc/G01N23-2276

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