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G01N 23/20058

Measuring diffraction of electrons, e.g. low energy electron diffraction [LEED] method or reflection high energy electron diffraction [RHEED] method

OverviewStructured DataIssuesContributors
Is a
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Patent classification
Classification Type
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Cooperative Patent Classification
Parent Classification
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G01N 23/20
Official Website
data.epo.org/linked-d...N23-20058

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