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David Vanore

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Edits on 14 Dec, 2021
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Golden AI
edited on 14 Dec, 2021
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Patent primary examiner of
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US Patent 7173255 Irradiation device
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US Patent 7180080 Method for retrofitting concrete structures
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US Patent 7186992 Method of fabricating a polarizing layer on an interface
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US Patent 7186993 Container system for the transport and storage of highly reactive materials
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US Patent 7193207 Methods and apparatus for driving a quadrupole ion trap device
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US Patent 7193229 Lithographic apparatus, illumination system and method for mitigating debris particles
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US Patent 7193230 Low-weight ultra-thin flexible radiation attenuation composition
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US Patent 7196328 Nanomachining method and apparatus
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US Patent 7196342 Systems and methods for reducing the influence of plasma-generated debris on the internal components of an EUV light source
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US Patent 7199364 Electrospray ion source apparatus
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US Patent 7199384 Inductively-driven light source for lithography
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US Patent 7202476 Charged-particle beam instrument
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US Patent 7205539 Sample charging control in charged-particle systems
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US Patent 7205550 Electron beam apparatus and method for production of its specimen chamber
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US Patent 7208728 Mass spectrometer
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US Patent 7208748 Programmable particle scatterer for radiation therapy beam formation
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US Patent 7211787 Particle movement device
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US Patent 7211792 Mass spectrometer
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US Patent 7220971 Multi-pixel electron microbeam irradiator systems and methods for selectively irradiating predetermined locations
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US Patent 7220972 Method and apparatus for the characterization and analysis of the shape of molecules and molecular clusters, and for the separation of desired isomers, based on Rydberg states
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US Patent 7223971 Method and apparatus for selecting inlets of a multiple inlet FAIMS
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US Patent 7223990 Ion beam irradiation device
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US Patent 7227133 Methods and apparatus for electron or positron capture dissociation
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US Patent 7227159 Ion implantation apparatus and ion implanting method
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US Patent 7230233 Analysis of data from a mass spectrometer
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US Patent 7232991 Mass spectrometer
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US Patent 7233008 Multiple electrode lens arrangement and a method for inspecting an object
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US Patent 7235783 Gas blowing nozzle of charged particle beam apparatus and charged particle beam apparatus as well as working method
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US Patent 7252799 Methods for sterilizing preparations containing albumin
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US Patent 7256395 Method and apparatus for improved sensitivity in a mass spectrometer
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US Patent 7259371 Method and apparatus for improved sensitivity in a mass spectrometer
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US Patent 7265362 Mass spectrometer
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US Patent 7267491 Ferrule assembly having highly protruding optical fibers and an associated fabrication method
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US Patent 7271397 Combined chemical/biological agent detection system and method utilizing mass spectrometry
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US Patent 7273683 Fiber optic devices having volume bragg grating elements
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US Patent 7274026 Apparatus and process for irradiating product pallets
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US Patent 7274029 Lithographic apparatus and device manufacturing method
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US Patent 7276714 Advanced pattern definition for particle-beam processing
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US Patent 7279689 Contact opening metrology
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US Patent 7279693 Source multiplexing in lithography
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US Patent 7291847 Specimen tip and tip holder assembly
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US Patent 7294830 Simultaneous acquisition of chemical information
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US Patent 7294841 Mass spectrometer
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US Patent 7297942 Method and device for cleaning desorption ion sources
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US Patent 7297945 Defective product inspection apparatus, probe positioning method and probe moving method
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US Patent 7301159 Charged particle beam apparatus and method of forming electrodes having narrow gap therebetween by using the same
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US Patent 7304320 Charged beam exposure apparatus, charged beam control method and manufacturing method of semiconductor device
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US Patent 7307265 Three section pig for radio-pharmaceuticals
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US Patent 7315022 High-speed electron beam inspection
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US Patent 7317188 TEM sample preparation from a circuit layer structure
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US Patent 7321118 Scanning transmission ion microscope
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US Patent 7321126 Collector with fastening devices for fastening mirror shells
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US Patent 7323694 Fluid treatment system and radiation source module for use therein
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US Patent 7323695 Reciprocating drive for scanning a workpiece
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US Patent 7326924 Method for obtaining high accuracy mass spectra using an ion trap mass analyser and a method for determining and/or reducing chemical shift in mass analysis using an ion trap mass analyser
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US Patent 7326937 Plasma ion implantation systems and methods using solid source of dopant material
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US Patent 7326944 Collapsible irradiation device
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US Patent 7329862 Mass spectrometer
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US Patent 7329866 Two-dimensional ion trap mass spectrometry
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US Patent 7329886 EUV illumination system having a plurality of light sources for illuminating an optical element
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US Patent 7342237 Lithographic apparatus and device manufacturing method
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US Patent 7345290 Lens array for electron beam lithography tool
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US Patent 7348558 Charged particle beam apparatus and automatic astigmatism adjustment method
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US Patent 7351958 Ion optics systems
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US Patent 7351969 Electron beam inspection system and inspection method and method of manufacturing devices using the system
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US Patent 7355173 Delineation of wafers
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US Patent 7355189 Charged particle therapy system, range modulation wheel device, and method of installing range modulation wheel device
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US Patent 7368709 Low field mobility separation of ions using segmented cylindrical FAIMS
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US Patent 7368743 Device for detecting fluorescent trace material
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US Patent 7372048 Source multiplexing in lithography
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US Patent 7375327 Method and device for measuring quantity of wear
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US Patent 7375329 Scanning electron microscope
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US Patent 7375354 Ion implanting method and apparatus
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US Patent 7378652 Nebulizer with plasma source
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US Patent 7378654 Processing probe
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US Patent 7378669 Lithographic apparatus, device manufacturing method, and device manufactured thereby
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US Patent 7381944 Systems and methods for ion species analysis with enhanced condition control and data interpretation
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US Patent 7381951 Charged particle beam adjustment method and apparatus
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US Patent 7385195 Semiconductor device tester
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US Patent 7385196 Method and scanning electron microscope for measuring width of material on sample
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US Patent 7385197 Electron beam apparatus and a device manufacturing method using the same apparatus
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US Patent 7388219 Fluorescent lamp with optimized UVA/UVB transmission
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US Patent 7420166 Real-time S-parameter imager
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US Patent 7449684 Mass spectrometer
Edits on 1 Dec, 2021
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Golden AI
edited on 1 Dec, 2021
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Infobox
Patent primary examiner of
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US Patent 7449684 Mass spectrometer
Edits on 1 Dec, 2021
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Golden AI
edited on 1 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
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US Patent 7420166 Real-time S-parameter imager
Edits on 30 Nov, 2021
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Golden AI
edited on 30 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
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US Patent 7388219 Fluorescent lamp with optimized UVA/UVB transmission
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Golden AI
edited on 30 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
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US Patent 7385196 Method and scanning electron microscope for measuring width of material on sample
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Golden AI
edited on 30 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
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US Patent 7385197 Electron beam apparatus and a device manufacturing method using the same apparatus
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Golden AI
edited on 30 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7385195 Semiconductor device tester
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Golden AI
edited on 30 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
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US Patent 7381951 Charged particle beam adjustment method and apparatus
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Golden AI
edited on 30 Nov, 2021
Golden AI profile picture
Golden AI
edited on 29 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
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US Patent 7378669 Lithographic apparatus, device manufacturing method, and device manufactured thereby
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Golden AI
edited on 29 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7378654 Processing probe
Golden AI profile picture
Golden AI
edited on 29 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7378652 Nebulizer with plasma source
Golden AI profile picture
Golden AI
edited on 29 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7375354 Ion implanting method and apparatus
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Golden AI
edited on 29 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7375329 Scanning electron microscope
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Golden AI
edited on 29 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7375327 Method and device for measuring quantity of wear
Edits on 26 Nov, 2021
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Golden AI
edited on 26 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7372048 Source multiplexing in lithography
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Golden AI
edited on 26 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7368743 Device for detecting fluorescent trace material
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Golden AI
edited on 26 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7368709 Low field mobility separation of ions using segmented cylindrical FAIMS
Edits on 25 Nov, 2021
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Golden AI
edited on 25 Nov, 2021
Golden AI profile picture
Golden AI
edited on 25 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
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US Patent 7355173 Delineation of wafers

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