SBIR/STTR Award attributes
Alphacore and Vanderbilt University will develop innovative, cost effective methodology and solutions for radiation testing of microelectronics, to evaluate and distinguish between radiation effects from a persistent beta environment and a persistent gamma environment, and determine the circumstances where testing for one environment is sufficient to show survivability in the other, or in a combined environment. We propose physics-based modeling enhanced survivability testing (MEST) strategy which will help to determine whether successful testing in one environment is sufficient to show survivability in the other or combined environment, and whether combined testing in both persistent beta and gamma environments is required or whether broader combined testing involving the full environment is necessary. In Phase I, feasibility of the MEST strategy will be established by performing the following tasks: Select representative gamma and beta environments (energy ranges, doses, fluences) for evaluation of potential differences in energy deposition via physics-based simulations using Vanderbilt’s Monte Carlo radiative energy deposition (MRED) code based on Geant4 libraries. Identify candidate device and integrated circuit (IC) structures to serve as appropriate test vehicles to evaluate differences in dose deposition in gamma, beta, and combined environments via MRED simulations. Perform beta testing of selected semiconductor devices that were previously tested in Co-60 gamma environment, and compare their total ionizing does (TID) responses for beta versus gamma. Perform initial MRED calculations of energy deposition and dose enhancement. Identify areas of similarity and differences. Select the appropriate test environment (beta, gamma, or combined) to enable evaluation of microelectronic survivability when exposed to a weapons-induced radiation environment. Define and select candidate test facilities to be used in Phase II. In Phase II, the team will implement the Phase I results in a prototype test design, to demonstrate the MEST methodology by conducting an experimental study where electronic parts are tested in partial and combined environments. We will determine whether existing methods of generating gamma and beta environments can be used, or whether innovative testing approaches are needed to show survivability in a combined environment. Approved for Public Release | 21-MDA-11013 (19 Nov 21)
