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Name	Description	Current Assignee	Patent Jurisdiction	Patent Number	Date of Patent
‌ US Patent 7245696 Element-specific X-ray fluorescence microscope and method of operation	Patent 7245696 was granted and assigned to Xradia on July, 2007 by the United States Patent and Trademark Office.	‌ Xradia	United States Patent and Trademark Office	7245696	July 17, 2007
‌ US Patent 7183547 Element-specific X-ray fluorescence microscope and method of operation	Patent 7183547 was granted and assigned to Xradia on February, 2007 by the United States Patent and Trademark Office.	‌ Xradia	United States Patent and Trademark Office	7183547	February 27, 2007
‌ US Patent 7787588 System and method for quantitative reconstruction of Zernike phase-contrast images	Patent 7787588 was granted and assigned to Xradia on August, 2010 by the United States Patent and Trademark Office.	‌ Xradia	United States Patent and Trademark Office	7787588	August 31, 2010
‌ US Patent 7268945 Short wavelength metrology imaging system	Patent 7268945 was granted and assigned to Xradia on September, 2007 by the United States Patent and Trademark Office.	‌ Xradia	United States Patent and Trademark Office	7268945	September 11, 2007
‌ US Patent 8068579 Process for examining mineral samples with X-ray microscope and projection systems	Patent 8068579 was granted and assigned to Xradia on November, 2011 by the United States Patent and Trademark Office.	‌ Xradia	United States Patent and Trademark Office	8068579	November 29, 2011
‌ US Patent 7394890 Optimized x-ray energy for high resolution imaging of integrated circuits structures	Patent 7394890 was granted and assigned to Xradia on July, 2008 by the United States Patent and Trademark Office.	‌ Xradia	United States Patent and Trademark Office	7394890	July 1, 2008
‌ US Patent 8353628 Method and system for tomographic projection correction	Patent 8353628 was granted and assigned to Xradia on January, 2013 by the United States Patent and Trademark Office.	‌ Xradia	United States Patent and Trademark Office	8353628	January 15, 2013
‌ US Patent 7920676 CD-GISAXS system and method	Patent 7920676 was granted and assigned to Xradia on April, 2011 by the United States Patent and Trademark Office.	‌ Xradia	United States Patent and Trademark Office	7920676	April 5, 2011
‌ US Patent 7297959 Lens bonded X-ray scintillator system and manufacturing method therefor	Patent 7297959 was granted and assigned to Xradia on November, 2007 by the United States Patent and Trademark Office.	‌ Xradia	United States Patent and Trademark Office	7297959	November 20, 2007
‌ US Patent 7406151 X-ray microscope with microfocus source and Wolter condenser	Patent 7406151 was granted and assigned to Xradia on July, 2008 by the United States Patent and Trademark Office.	‌ Xradia	United States Patent and Trademark Office	7406151	July 29, 2008
‌ US Patent 6885503 Achromatic fresnel optics based lithography for short wavelength electromagnetic radiations	Patent 6885503 was granted and assigned to Xradia on April, 2005 by the United States Patent and Trademark Office.	‌ Xradia	United States Patent and Trademark Office	6885503	April 26, 2005
‌ US Patent 7974379 Metrology and registration system and method for laminography and tomography	Patent 7974379 was granted and assigned to Xradia on July, 2011 by the United States Patent and Trademark Office.	‌ Xradia	United States Patent and Trademark Office	7974379	July 5, 2011
‌ US Patent 7400704 High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray source	Patent 7400704 was granted and assigned to Xradia on July, 2008 by the United States Patent and Trademark Office.	‌ Xradia	United States Patent and Trademark Office	7400704	July 15, 2008
‌ US Patent 6917472 Achromatic fresnel optics for ultraviolet and x-ray radiation	Patent 6917472 was granted and assigned to Xradia on July, 2005 by the United States Patent and Trademark Office.	‌ Xradia	United States Patent and Trademark Office	6917472	July 12, 2005
‌ US Patent 7499521 System and method for fuel cell material x-ray analysis	Patent 7499521 was granted and assigned to Xradia on March, 2009 by the United States Patent and Trademark Office.	‌ Xradia	United States Patent and Trademark Office	7499521	March 3, 2009
‌ US Patent 7119953 Phase contrast microscope for short wavelength radiation and imaging method	Patent 7119953 was granted and assigned to Xradia on October, 2006 by the United States Patent and Trademark Office.	‌ Xradia	United States Patent and Trademark Office	7119953	October 10, 2006
‌ US Patent 7813475 X-ray microscope with switchable x-ray source	Patent 7813475 was granted and assigned to Xradia on October, 2010 by the United States Patent and Trademark Office.	‌ Xradia	United States Patent and Trademark Office	7813475	October 12, 2010
‌ US Patent 7414787 Phase contrast microscope for short wavelength radiation and imaging method	Patent 7414787 was granted and assigned to Xradia on August, 2008 by the United States Patent and Trademark Office.	‌ Xradia	United States Patent and Trademark Office	7414787	August 19, 2008
‌ US Patent 7130375 High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray source	Patent 7130375 was granted and assigned to Xradia on October, 2006 by the United States Patent and Trademark Office.	‌ Xradia	United States Patent and Trademark Office	7130375	October 31, 2006
‌ US Patent 7365918 Fast x-ray lenses and fabrication method therefor	Patent 7365918 was granted and assigned to Xradia on April, 2008 by the United States Patent and Trademark Office.	‌ Xradia	United States Patent and Trademark Office	7365918	April 29, 2008
‌ US Patent 7095822 Near-field X-ray fluorescence microprobe	Patent 7095822 was granted and assigned to Xradia on August, 2006 by the United States Patent and Trademark Office.	‌ Xradia	United States Patent and Trademark Office	7095822	August 22, 2006
‌ US Patent 7796725 Mechanism for switching sources in x-ray microscope	Patent 7796725 was granted and assigned to Xradia on September, 2010 by the United States Patent and Trademark Office.	‌ Xradia	United States Patent and Trademark Office	7796725	September 14, 2010
‌ US Patent 7388942 X-ray micro-tomography system optimized for high resolution, throughput, image quality	Patent 7388942 was granted and assigned to Xradia on June, 2008 by the United States Patent and Trademark Office.	‌ Xradia	United States Patent and Trademark Office	7388942	June 17, 2008
‌ US Patent 7561662 X-ray micro-tomography system optimized for high resolution, throughput, image quality	Patent 7561662 was granted and assigned to Xradia on July, 2009 by the United States Patent and Trademark Office.	‌ Xradia	United States Patent and Trademark Office	7561662	July 14, 2009
‌ US Patent 7215736 X-ray micro-tomography system optimized for high resolution, throughput, image quality	Patent 7215736 was granted and assigned to Xradia on May, 2007 by the United States Patent and Trademark Office.	‌ Xradia	United States Patent and Trademark Office	7215736	May 8, 2007

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