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List of Invarium patents

List of Invarium patents

List of Critical Outcome Technologies, Inc. patents

List of Agri-Starts, Inc. patents

List of Streamline Automation, LLC patents

CEOs of commodity companies

Founders educated at University of Tübingen

Patents where

Current Assignee

Name

is

‌

Invarium

	Name	Description	Patent Applicant	Current Assignee	Inventor	Patent Jurisdiction	Patent Number	Date of Patent
	‌ US Patent 7392502 Method for real time monitoring and verifying optical proximity correction model and method	Patent 7392502 was granted and assigned to Invarium on June, 2008 by the United States Patent and Trademark Office.		‌ Invarium		United States Patent and Trademark Office	7392502	June 24, 2008
	‌ US Patent 7246343 Method for correcting position-dependent distortions in patterning of integrated circuits	Patent 7246343 was granted and assigned to Invarium on July, 2007 by the United States Patent and Trademark Office.		‌ Invarium		United States Patent and Trademark Office	7246343	July 17, 2007
	‌ US Patent 7444615 Calibration on wafer sweet spots	Patent 7444615 was granted and assigned to Invarium on October, 2008 by the United States Patent and Trademark Office.		‌ Invarium		United States Patent and Trademark Office	7444615	October 28, 2008
	‌ US Patent 7224437 Method for measuring and verifying stepper illumination	Patent 7224437 was granted and assigned to Invarium on May, 2007 by the United States Patent and Trademark Office.		‌ Invarium		United States Patent and Trademark Office	7224437	May 29, 2007
	‌ US Patent 7379170 Apparatus and method for characterizing an image system in lithography projection tool	Patent 7379170 was granted and assigned to Invarium on May, 2008 by the United States Patent and Trademark Office.		‌ Invarium		United States Patent and Trademark Office	7379170	May 27, 2008
	‌ US Patent 7277165 Method of characterizing flare	Patent 7277165 was granted and assigned to Invarium on October, 2007 by the United States Patent and Trademark Office.		‌ Invarium		United States Patent and Trademark Office	7277165	October 2, 2007
	‌ US Patent 7275225 Correcting design data for manufacture	Patent 7275225 was granted and assigned to Invarium on September, 2007 by the United States Patent and Trademark Office.		‌ Invarium		United States Patent and Trademark Office	7275225	September 25, 2007
	‌ US Patent 7189481 Characterizing flare of a projection lens	Patent 7189481 was granted and assigned to Invarium on March, 2007 by the United States Patent and Trademark Office.		‌ Invarium		United States Patent and Trademark Office	7189481	March 13, 2007
	‌ US Patent 7401319 Method and system for reticle-wide hierarchy management for representational and computational reuse in integrated circuit layout design	Patent 7401319 was granted and assigned to Invarium on July, 2008 by the United States Patent and Trademark Office.		‌ Invarium		United States Patent and Trademark Office	7401319	July 15, 2008
	‌ US Patent 7266800 Method and system for designing manufacturable patterns that account for the pattern- and position-dependent nature of patterning processes	Patent 7266800 was granted and assigned to Invarium on September, 2007 by the United States Patent and Trademark Office.		‌ Invarium		United States Patent and Trademark Office	7266800	September 4, 2007
	‌ US Patent 7318214 System and method for reducing patterning variability in integrated circuit manufacturing through mask layout corrections	Patent 7318214 was granted and assigned to Invarium on January, 2008 by the United States Patent and Trademark Office.		‌ Invarium		United States Patent and Trademark Office	7318214	January 8, 2008

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