List of Brion Technologies patents

Patents where

Current Assignee

Name

‌

Brion Technologies

Name	Description	Current Assignee	Patent Jurisdiction	Patent Number	Date of Patent
‌ US Patent 7233874 Method and apparatus for monitoring integrated circuit fabrication	Patent 7233874 was granted and assigned to Brion Technologies on June, 2007 by the United States Patent and Trademark Office.	‌ Brion Technologies	United States Patent and Trademark Office	7233874	June 19, 2007
‌ US Patent 6959255 Method and apparatus for monitoring integrated circuit fabrication	Patent 6959255 was granted and assigned to Brion Technologies on October, 2005 by the United States Patent and Trademark Office.	‌ Brion Technologies	United States Patent and Trademark Office	6959255	October 25, 2005
‌ US Patent 7117478 System and method for lithography simulation	Patent 7117478 was granted and assigned to Brion Technologies on October, 2006 by the United States Patent and Trademark Office.	‌ Brion Technologies	United States Patent and Trademark Office	7117478	October 3, 2006
‌ US Patent 7003758 System and method for lithography simulation	Patent 7003758 was granted and assigned to Brion Technologies on February, 2006 by the United States Patent and Trademark Office.	‌ Brion Technologies	United States Patent and Trademark Office	7003758	February 21, 2006
‌ US Patent 7111277 System and method for lithography simulation	Patent 7111277 was granted and assigned to Brion Technologies on September, 2006 by the United States Patent and Trademark Office.	‌ Brion Technologies	United States Patent and Trademark Office	7111277	September 19, 2006
‌ US Patent 7587704 System and method for mask verification using an individual mask error model	Patent 7587704 was granted and assigned to Brion Technologies on September, 2009 by the United States Patent and Trademark Office.	‌ Brion Technologies	United States Patent and Trademark Office	7587704	September 8, 2009
‌ US Patent 6969837 System and method for lithography process monitoring and control	Patent 6969837 was granted and assigned to Brion Technologies on November, 2005 by the United States Patent and Trademark Office.	‌ Brion Technologies	United States Patent and Trademark Office	6969837	November 29, 2005
‌ US Patent 7488933 Method for lithography model calibration	Patent 7488933 was granted and assigned to Brion Technologies on February, 2009 by the United States Patent and Trademark Office.	‌ Brion Technologies	United States Patent and Trademark Office	7488933	February 10, 2009
‌ US Patent 7171334 Method and apparatus for synchronizing data acquisition of a monitored IC fabrication process	Patent 7171334 was granted and assigned to Brion Technologies on January, 2007 by the United States Patent and Trademark Office.	‌ Brion Technologies	United States Patent and Trademark Office	7171334	January 30, 2007
‌ US Patent 7564017 System and method for characterizing aerial image quality in a lithography system	Patent 7564017 was granted and assigned to Brion Technologies on July, 2009 by the United States Patent and Trademark Office.	‌ Brion Technologies	United States Patent and Trademark Office	7564017	July 21, 2009
‌ US Patent 7703069 Three-dimensional mask model for photolithography simulation	Patent 7703069 was granted and assigned to Brion Technologies on April, 2010 by the United States Patent and Trademark Office.	‌ Brion Technologies	United States Patent and Trademark Office	7703069	April 20, 2010
‌ US Patent 7617477 Method for selecting and optimizing exposure tool using an individual mask error model	Patent 7617477 was granted and assigned to Brion Technologies on November, 2009 by the United States Patent and Trademark Office.	‌ Brion Technologies	United States Patent and Trademark Office	7617477	November 10, 2009
‌ US Patent 7707538 Multivariable solver for optical proximity correction	Patent 7707538 was granted and assigned to Brion Technologies on April, 2010 by the United States Patent and Trademark Office.	‌ Brion Technologies	United States Patent and Trademark Office	7707538	April 27, 2010
‌ US Patent 7694267 Method for process window optimized optical proximity correction	Patent 7694267 was granted and assigned to Brion Technologies on April, 2010 by the United States Patent and Trademark Office.	‌ Brion Technologies	United States Patent and Trademark Office	7694267	April 6, 2010
‌ US Patent 7120895 System and method for lithography simulation	Patent 7120895 was granted and assigned to Brion Technologies on October, 2006 by the United States Patent and Trademark Office.	‌ Brion Technologies	United States Patent and Trademark Office	7120895	October 10, 2006
‌ US Patent 7695876 Method for identifying and using process window signature patterns for lithography process control	Patent 7695876 was granted and assigned to Brion Technologies on April, 2010 by the United States Patent and Trademark Office.	‌ Brion Technologies	United States Patent and Trademark Office	7695876	April 13, 2010
‌ US Patent 7558419 System and method for detecting integrated circuit pattern defects	Patent 7558419 was granted and assigned to Brion Technologies on July, 2009 by the United States Patent and Trademark Office.	‌ Brion Technologies	United States Patent and Trademark Office	7558419	July 7, 2009
‌ US Patent 7114145 System and method for lithography simulation	Patent 7114145 was granted and assigned to Brion Technologies on September, 2006 by the United States Patent and Trademark Office.	‌ Brion Technologies	United States Patent and Trademark Office	7114145	September 26, 2006
‌ US Patent 7053355 System and method for lithography process monitoring and control	Patent 7053355 was granted and assigned to Brion Technologies on May, 2006 by the United States Patent and Trademark Office.	‌ Brion Technologies	United States Patent and Trademark Office	7053355	May 30, 2006
‌ US Patent 6906305 System and method for aerial image sensing	Patent 6906305 was granted and assigned to Brion Technologies on June, 2005 by the United States Patent and Trademark Office.	‌ Brion Technologies	United States Patent and Trademark Office	6906305	June 14, 2005
‌ US Patent 6969864 System and method for lithography process monitoring and control	Patent 6969864 was granted and assigned to Brion Technologies on November, 2005 by the United States Patent and Trademark Office.	‌ Brion Technologies	United States Patent and Trademark Office	6969864	November 29, 2005
‌ US Patent 6879924 Method and apparatus for monitoring integrated circuit fabrication	Patent 6879924 was granted and assigned to Brion Technologies on April, 2005 by the United States Patent and Trademark Office.	‌ Brion Technologies	United States Patent and Trademark Office	6879924	April 12, 2005
‌ US Patent 6892156 Method and apparatus for monitoring integrated circuit fabrication	Patent 6892156 was granted and assigned to Brion Technologies on May, 2005 by the United States Patent and Trademark Office.	‌ Brion Technologies	United States Patent and Trademark Office	6892156	May 10, 2005
‌ US Patent 6884984 System and method for lithography process monitoring and control	Patent 6884984 was granted and assigned to Brion Technologies on April, 2005 by the United States Patent and Trademark Office.	‌ Brion Technologies	United States Patent and Trademark Office	6884984	April 26, 2005

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