List of Anasys Instruments patents

List of Anasys Instruments patents

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Patents where

Current Assignee

Name

is

Anasys Instruments

	Name	Description	Patent Applicant	Current Assignee	Inventor	Patent Jurisdiction	Patent Number	Date of Patent
	‌ US Patent 9658247 Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopy	Patent 9658247 was granted and assigned to Anasys Instruments on May, 2017 by the United States Patent and Trademark Office.	Anasys Instruments	Anasys Instruments		United States Patent and Trademark Office	9658247	May 23, 2017
	‌ US Patent 9372154 Method and apparatus for infrared scattering scanning near-field optical microscopy	Patent 9372154 was granted and assigned to Anasys Instruments on June, 2016 by the United States Patent and Trademark Office.		Anasys Instruments		United States Patent and Trademark Office	9372154	June 21, 2016
	‌ US Patent 9046492 Stimulated raman nanospectroscopy	Patent 9046492 was granted and assigned to Anasys Instruments on June, 2015 by the United States Patent and Trademark Office.		Anasys Instruments		United States Patent and Trademark Office	9046492	June 2, 2015
	‌ US Patent 8177422 Transition temperature microscopy	Patent 8177422 was granted and assigned to Anasys Instruments on May, 2012 by the United States Patent and Trademark Office.		Anasys Instruments		United States Patent and Trademark Office	8177422	May 15, 2012
	‌ US Patent 8242448 Dynamic power control, beam alignment and focus for nanoscale spectroscopy	Patent 8242448 was granted and assigned to Anasys Instruments on August, 2012 by the United States Patent and Trademark Office.		Anasys Instruments		United States Patent and Trademark Office	8242448	August 14, 2012
	‌ US Patent 7497613 Probe with embedded heater for nanoscale analysis	Patent 7497613 was granted and assigned to Anasys Instruments on March, 2009 by the United States Patent and Trademark Office.		Anasys Instruments		United States Patent and Trademark Office	7497613	March 3, 2009
	‌ US Patent 8001830 High frequency deflection measurement of IR absorption	Patent 8001830 was granted and assigned to Anasys Instruments on August, 2011 by the United States Patent and Trademark Office.		Anasys Instruments		United States Patent and Trademark Office	8001830	August 23, 2011
	‌ US Patent 8402819 High frequency deflection measurement of IR absorption	Patent 8402819 was granted and assigned to Anasys Instruments on March, 2013 by the United States Patent and Trademark Office.		Anasys Instruments		United States Patent and Trademark Office	8402819	March 26, 2013
	‌ US Patent 8646319 Dynamic power control for nanoscale spectroscopy	Patent 8646319 was granted and assigned to Anasys Instruments on February, 2014 by the United States Patent and Trademark Office.		Anasys Instruments		United States Patent and Trademark Office	8646319	February 11, 2014
	‌ US Patent 8869602 High frequency deflection measurement of IR absorption	Patent 8869602 was granted and assigned to Anasys Instruments on October, 2014 by the United States Patent and Trademark Office.		Anasys Instruments		United States Patent and Trademark Office	8869602	October 28, 2014
	‌ US Patent 8418538 High frequency deflection measurement of IR absorption	Patent 8418538 was granted and assigned to Anasys Instruments on April, 2013 by the United States Patent and Trademark Office.		Anasys Instruments		United States Patent and Trademark Office	8418538	April 16, 2013
	‌ US Patent 9778282 Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopy	Patent 9778282 was granted and assigned to Anasys Instruments on October, 2017 by the United States Patent and Trademark Office.	Anasys Instruments	Anasys Instruments		United States Patent and Trademark Office	9778282	October 3, 2017
	‌ US Patent 8793811 Method and apparatus for infrared scattering scanning near-field optical microscopy	Patent 8793811 was granted and assigned to Anasys Instruments on July, 2014 by the United States Patent and Trademark Office.		Anasys Instruments		United States Patent and Trademark Office	8793811	July 29, 2014
	‌ US Patent 8607622 High frequency deflection measurement of IR absorption	Patent 8607622 was granted and assigned to Anasys Instruments on December, 2013 by the United States Patent and Trademark Office.		Anasys Instruments		United States Patent and Trademark Office	8607622	December 17, 2013
	‌ US Patent 8680467 High frequency deflection measurement of IR absorption with a modulated IR source	Patent 8680467 was granted and assigned to Anasys Instruments on March, 2014 by the United States Patent and Trademark Office.		Anasys Instruments		United States Patent and Trademark Office	8680467	March 25, 2014
	‌ US Patent 7977636 Infrared imaging using thermal radiation from a scanning probe tip	Patent 7977636 was granted and assigned to Anasys Instruments on July, 2011 by the United States Patent and Trademark Office.		Anasys Instruments		United States Patent and Trademark Office	7977636	July 12, 2011

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