List of Aehr Test Systems patents

Patents where

Current Assignee

Name

Aehr Test Systems

Name	Description	Patent Applicant	Current Assignee	Patent Jurisdiction	Patent Number	Date of Patent
‌ US Patent 7541822 Wafer burn-in and text employing detachable cartridge	Patent 7541822 was granted and assigned to Aehr Test Systems on June, 2009 by the United States Patent and Trademark Office.		Aehr Test Systems	United States Patent and Trademark Office	7541822	June 2, 2009
‌ US Patent 6853209 Contactor assembly for testing electrical circuits	Patent 6853209 was granted and assigned to Aehr Test Systems on February, 2005 by the United States Patent and Trademark Office.		Aehr Test Systems	United States Patent and Trademark Office	6853209	February 8, 2005
‌ US Patent 10401385 Limiting translation for consistent substrate-to-substrate contact	Patent 10401385 was granted and assigned to Aehr Test Systems on September, 2019 by the United States Patent and Trademark Office.	Aehr Test Systems	Aehr Test Systems	United States Patent and Trademark Office	10401385	September 3, 2019
‌ US Patent 7053644 System for testing and burning in of integrated circuits	Patent 7053644 was granted and assigned to Aehr Test Systems on May, 2006 by the United States Patent and Trademark Office.		Aehr Test Systems	United States Patent and Trademark Office	7053644	May 30, 2006
‌ US Patent 11112429 Pressure relief valve	Patent 11112429 was granted and assigned to Aehr Test Systems on September, 2021 by the United States Patent and Trademark Office.	Aehr Test Systems	Aehr Test Systems	United States Patent and Trademark Office	11112429	September 7, 2021
‌ US Patent 9880197 Controlling alignment during a thermal cycle	Patent 9880197 was granted and assigned to Aehr Test Systems on January, 2018 by the United States Patent and Trademark Office.	Aehr Test Systems	Aehr Test Systems	United States Patent and Trademark Office	9880197	January 30, 2018
‌ US Patent 9625521 Controlling alignment during a thermal cycle	Patent 9625521 was granted and assigned to Aehr Test Systems on April, 2017 by the United States Patent and Trademark Office.	Aehr Test Systems	Aehr Test Systems	United States Patent and Trademark Office	9625521	April 18, 2017
‌ US Patent 8388357 Apparatus for testing electronic devices	Patent 8388357 was granted and assigned to Aehr Test Systems on March, 2013 by the United States Patent and Trademark Office.		Aehr Test Systems	United States Patent and Trademark Office	8388357	March 5, 2013
‌ US Patent 7762822 Apparatus for testing electronic devices	Patent 7762822 was granted and assigned to Aehr Test Systems on July, 2010 by the United States Patent and Trademark Office.		Aehr Test Systems	United States Patent and Trademark Office	7762822	July 27, 2010
‌ US Patent 8947116 System for testing an integrated circuit of a device and its method of use	Patent 8947116 was granted and assigned to Aehr Test Systems on February, 2015 by the United States Patent and Trademark Office.		Aehr Test Systems	United States Patent and Trademark Office	8947116	February 3, 2015
‌ US Patent 8030957 System for testing an integrated circuit of a device and its method of use	Patent 8030957 was granted and assigned to Aehr Test Systems on October, 2011 by the United States Patent and Trademark Office.		Aehr Test Systems	United States Patent and Trademark Office	8030957	October 4, 2011
‌ US Patent 11592465 Pressure relief valve	Patent 11592465 was granted and assigned to Aehr Test Systems on February, 2023 by the United States Patent and Trademark Office.	Aehr Test Systems	Aehr Test Systems	United States Patent and Trademark Office	11592465	February 28, 2023
‌ US Patent 9316683 Apparatus for testing electronic devices	Patent 9316683 was granted and assigned to Aehr Test Systems on April, 2016 by the United States Patent and Trademark Office.	Aehr Test Systems	Aehr Test Systems	United States Patent and Trademark Office	9316683	April 19, 2016
‌ US Patent 11255903 Apparatus for testing electronic devices	Patent 11255903 was granted and assigned to Aehr Test Systems on February, 2022 by the United States Patent and Trademark Office.	Aehr Test Systems	Aehr Test Systems	United States Patent and Trademark Office	11255903	February 22, 2022
‌ US Patent 8628336 Apparatus for testing electronic devices	Patent 8628336 was granted and assigned to Aehr Test Systems on January, 2014 by the United States Patent and Trademark Office.		Aehr Test Systems	United States Patent and Trademark Office	8628336	January 14, 2014
‌ US Patent 7826995 Apparatus for testing electronic devices	Patent 7826995 was granted and assigned to Aehr Test Systems on November, 2010 by the United States Patent and Trademark Office.		Aehr Test Systems	United States Patent and Trademark Office	7826995	November 2, 2010
‌ US Patent 6867608 Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component	Patent 6867608 was granted and assigned to Aehr Test Systems on March, 2005 by the United States Patent and Trademark Office.		Aehr Test Systems	United States Patent and Trademark Office	6867608	March 15, 2005
‌ US Patent 7303929 Reloading of die carriers without removal of die carriers from sockets on test boards	Patent 7303929 was granted and assigned to Aehr Test Systems on December, 2007 by the United States Patent and Trademark Office.		Aehr Test Systems	United States Patent and Trademark Office	7303929	December 4, 2007
‌ US Patent 7385407 Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component	Patent 7385407 was granted and assigned to Aehr Test Systems on June, 2008 by the United States Patent and Trademark Office.		Aehr Test Systems	United States Patent and Trademark Office	7385407	June 10, 2008
‌ US Patent 9250291 System for testing an integrated circuit of a device and its method of use	Patent 9250291 was granted and assigned to Aehr Test Systems on February, 2016 by the United States Patent and Trademark Office.		Aehr Test Systems	United States Patent and Trademark Office	9250291	February 2, 2016
‌ US Patent 8228085 System for testing an integrated circuit of a device and its method of use	Patent 8228085 was granted and assigned to Aehr Test Systems on July, 2012 by the United States Patent and Trademark Office.		Aehr Test Systems	United States Patent and Trademark Office	8228085	July 24, 2012
‌ US Patent 8118618 Apparatus for testing electronic devices	Patent 8118618 was granted and assigned to Aehr Test Systems on February, 2012 by the United States Patent and Trademark Office.		Aehr Test Systems	United States Patent and Trademark Office	8118618	February 21, 2012
‌ US Patent 10094872 Apparatus for testing electronic devices	Patent 10094872 was granted and assigned to Aehr Test Systems on October, 2018 by the United States Patent and Trademark Office.	Aehr Test Systems	Aehr Test Systems	United States Patent and Trademark Office	10094872	October 9, 2018
‌ US Patent 7969175 Separate test electronics and blower modules in an apparatus for testing an integrated circuit	Patent 7969175 was granted and assigned to Aehr Test Systems on June, 2011 by the United States Patent and Trademark Office.		Aehr Test Systems	United States Patent and Trademark Office	7969175	June 28, 2011
‌ US Patent 9291668 Electronics tester with a valve integrally formed in a component of a portable pack	Patent 9291668 was granted and assigned to Aehr Test Systems on March, 2016 by the United States Patent and Trademark Office.	Aehr Test Systems	Aehr Test Systems	United States Patent and Trademark Office	9291668	March 22, 2016

Results per page:

61 results

0 selected

61 results

0 selected