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US Patent 9443312 Line parametric object estimation

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Patent
Patent
1

Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
1
Patent Number
94433121
Patent Inventor Names
Gregory Walsh1
Derik Schroeter1
Date of Patent
September 13, 2016
1
Patent Application Number
144735071
Date Filed
August 29, 2014
1
Patent Citations Received
‌
US Patent 11703457 Structure diagnosis system and structure diagnosis method
2
Patent Primary Examiner
‌
Jayesh A Patel
1
Patent abstract

A method may include projecting, onto a first projection plane of a first projection volume, first points from a point cloud of a setting that are within the first projection volume. Further, the method may include matching a plurality of the projected first points with a cross-section template that corresponds to a line parametric object (LPO) of the setting to determine a plurality of first element points of a first primary projected element. Additionally, the method may include projecting, onto a second projection plane of a second projection volume, second points from the point cloud that are within the second projection volume and matching a plurality of the projected second points with the cross-section template to determine a plurality of second element points of a second primary projected element. Moreover, the method may include generating a parameter function based on the first element points and the second element points.

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