US Patent 8418538 High frequency deflection measurement of IR absorption
Patent 8418538 was granted and assigned to Anasys Instruments on April, 2013 by the United States Patent and Trademark Office.
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Patent abstract
An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Significant issues as to size, cost of implementation, and repeatability/robustness of results exist in commercializing the technique. The invention addresses many of these issues thereby producing a version of the analytical technique that can be made generally available to the scientific community.
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Patent Inventor Names
A. Dazzi Dazzi0
Clotilde Policar0
Craig Prater0
Kevin Kjoller0
Konstantin Vodopyanov0
Michael Reading0
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US Patent 08418538 High frequency deflection measurement of IR absorption US Patent 8418538 High frequency deflection measurement of IR absorption
Infobox
Patent Number
084185380
Patent Number
84185380
Edits on 28 Sep, 2022
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Infobox
Is a
Current Assignee
Patent Jurisdiction
Patent Number
084185380
Date of Patent
April 16, 2013
0Patent Application Number
132896400
Date Filed
November 4, 2011
0Patent Primary Examiner
Edits on 16 Dec, 2021
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Infobox (+8 properties)
US Patent 08418538 High frequency deflection measurement of IR absorption
Infobox
Is a
Current assignee
Patent jurisdiction
Patent number
08418538
Date of patent
April 16, 2013
Patent application number
13289640
Date Filed
November 4, 2011
Patent primary examiner
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