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US Patent 8418538 High frequency deflection measurement of IR absorption

Patent 8418538 was granted and assigned to Anasys Instruments on April, 2013 by the United States Patent and Trademark Office.

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Patent
Patent
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Current Assignee
Anasys Instruments
Anasys Instruments
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
84185380
Patent Inventor Names
Michael Reading0
Craig Prater0
Kevin Kjoller0
Konstantin Vodopyanov0
A. Dazzi Dazzi0
Clotilde Policar0
Date of Patent
April 16, 2013
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Patent Application Number
132896400
Date Filed
November 4, 2011
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Patent Primary Examiner
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Daniel Larkin
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Patent abstract

An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Significant issues as to size, cost of implementation, and repeatability/robustness of results exist in commercializing the technique. The invention addresses many of these issues thereby producing a version of the analytical technique that can be made generally available to the scientific community.

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