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US Patent 7875859 Ion energy analyzer and methods of manufacturing and operating

Patent 7875859 was granted and assigned to Tokyo Electron on January, 2011 by the United States Patent and Trademark Office.

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Patent
Patent
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Patent attributes

Current Assignee
Tokyo Electron
Tokyo Electron
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
78758590
Patent Inventor Names
Lee Chen0
Ronald Victor Bravenec0
Lin Xu0
Date of Patent
January 25, 2011
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Patent Application Number
120598550
Date Filed
March 31, 2008
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Patent Citations Received
‌
US Patent 11996276 Ion collector for use in plasma systems
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Patent Primary Examiner
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Bernard E Souw
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Patent abstract

An ion energy analyzer is described for use in diagnosing the ion energy distribution (IED) of ions incident on a radio frequency (RF) biased substrate immersed in plasma. The ion energy analyzer comprises an entrance grid exposed to the plasma, an ion selection grid disposed proximate to the entrance grid, an electron rejection grid disposed proximate to the ion selection grid, and an ion current collector disposed proximate to the electron rejection grid. The ion selection grid is coupled to an ion selection voltage source configured to positively bias the ion selection grid by an ion selection voltage, and the electron rejection grid is coupled to an electron rejection voltage source configured to negatively bias the electron rejection grid by an electron rejection voltage. Furthermore, an ion current meter is coupled to the ion current collector to measure the ion current.

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