US Patent 7824865 Method for examining WT1-related disease
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Patent abstract
The invention provides a method for testing a WT1-related disease, such as leukemia, a solid cancer, or an atypia, for diagnosing the disease, evaluating the course of cure and the prognosis of the disease more simply with high reliability, the method comprises measuring the amount of antibody against WT1 in a sample and using the measurement value and the time course of the value as a clinical marker for the testing.
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Patent Inventor Names
Haruo Sugiyama0
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US Patent 07824865 Method for examining WT1-related disease US Patent 7824865 Method for examining WT1-related disease
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Patent Number
078248650
Patent Number
78248650
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Patent Jurisdiction
Patent Number
078248650
Date of Patent
November 2, 2010
0Patent Application Number
110371280
Date Filed
January 19, 2005
0Official Website
Patent Primary Examiner
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US Patent 07824865 Method for examining WT1-related disease
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Is a
Patent jurisdiction
Patent number
07824865
Date of patent
November 2, 2010
Patent application number
11037128
Date Filed
January 19, 2005
Patent primary examiner
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