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US Patent 7808649 Fixed-point detector and displacement-measuring apparatus

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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
7808649
Patent Inventor Names
Hideaki Tamiya1
Akihiro Kuroda1
Date of Patent
October 5, 2010
Patent Application Number
12144772
Date Filed
June 24, 2008
Patent Primary Examiner
‌
Tarifur Chowdhury
Patent abstract

A fixed-point detector is provided. The fixed-point detector includes a plurality of fixed-point detecting patterns, a fixed-point detecting light source, and a plurality of photoelectric conversion elements. The plurality of fixed-point detecting patterns each have a pair of diffraction gratings for diffracting incident light in different directions. The fixed-point detecting light source irradiates the pair of diffraction gratings with light while moving in the measurement-axis direction with respect to the plurality of fixed-point detecting patterns. The plurality of photoelectric conversion elements move together with the fixed-point detecting light source, while receiving light beams diffracted by the respective diffraction gratings of the plurality of fixed-point detecting patterns and converting the diffracted light beams into electric signals.

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