Is a
Patent attributes
Patent Jurisdiction
Patent Number
Date of Patent
November 17, 2009
Patent Application Number
11600354
Date Filed
November 16, 2006
Patent Primary Examiner
Patent abstract
One embodiment of the present invention provides a system including a tester and a back end manufacturing system. The tester tests a resistive memory and obtains configuration data for the resistive memory. The back end manufacturing system prevents temperatures in back end processing from reducing data retention time of the configuration data in the resistive memory.
Timeline
No Timeline data yet.
Further Resources
No Further Resources data yet.
