Patent 7222277 was granted and assigned to Nec Laboratories America, Inc. on May, 2007 by the United States Patent and Trademark Office.
A test output compaction architecture and method that takes advantage of a response shaper in order to minimize masking of faults during compaction. A response shaper is inserted between a plurality of scan chains and an output compactor. The response shaper receives output responses from scan chains and reshapes the output responses in a manner that minimizes masking of faults by the output compactor.