Log in
Enquire now
‌

US Patent 7221214 Delay value adjusting method and semiconductor integrated circuit

OverviewStructured DataIssuesContributors

Contents

Patent abstractTimelineTable: Further ResourcesReferences
Is a
Patent
Patent
1

Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
1
Patent Number
72212141
Patent Inventor Names
Moriyuki Santou1
Date of Patent
May 22, 2007
1
Patent Application Number
109689441
Date Filed
October 21, 2004
1
Patent Primary Examiner
‌
Timothy P. Callahan
1
Patent abstract

The method provides wide-range delay value adjustment without making changes in cell size and metal wiring, even when a process variation occurs. Threshold values of some or all of the transistors which form the delay gate inserted into the signal path are varied to control the delay value of the delay gate, so that the delay value of the signal path is adjusted.

Timeline

No Timeline data yet.

Further Resources

Title
Author
Link
Type
Date
No Further Resources data yet.

References

Find more entities like US Patent 7221214 Delay value adjusting method and semiconductor integrated circuit

Use the Golden Query Tool to find similar entities by any field in the Knowledge Graph, including industry, location, and more.
Open Query Tool
Access by API
Golden Query Tool
Golden logo

Company

  • Home
  • Press & Media
  • Blog
  • Careers
  • WE'RE HIRING

Products

  • Knowledge Graph
  • Query Tool
  • Data Requests
  • Knowledge Storage
  • API
  • Pricing
  • Enterprise
  • ChatGPT Plugin

Legal

  • Terms of Service
  • Enterprise Terms of Service
  • Privacy Policy

Help

  • Help center
  • API Documentation
  • Contact Us
By using this site, you agree to our Terms of Service.