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US Patent 11526393 Memory sub-system with dynamic calibration using component-based function(s)

Patent 11526393 was granted and assigned to Micron Technology on December, 2022 by the United States Patent and Trademark Office.

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Is a
Patent
Patent
1

Patent attributes

Patent Applicant
Micron Technology
Micron Technology
1
Current Assignee
Micron Technology
Micron Technology
1
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
1
Patent Number
115263931
Patent Inventor Names
Violante Moschiano1
Bruce A. Liikanen1
Gerald L. Cadloni1
Date of Patent
December 13, 2022
1
Patent Application Number
172008931
Date Filed
March 14, 2021
1
Patent Citations
‌
US Patent 10521140 Memory device with dynamic program-verify voltage calibration
1
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US Patent 10566063 Memory system with dynamic calibration using a trim management mechanism
‌
US Patent 10877827 Read voltage optimization
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US Patent 10936205 Techniques for retention and read-disturb aware health binning
1
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US Patent 11176036 Endurance enhancement scheme using memory re-evaluation
1
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US Patent 10963327 Detecting error count deviations for non-volatile memory blocks for advanced non-volatile memory block management
‌
US Patent 10140040 Memory device with dynamic program-verify voltage calibration
‌
US Patent 10170195 Threshold voltage shifting at a lower bit error rate by intelligently performing dummy configuration reads
...
Patent Primary Examiner
‌
Joshua P Lottich
1
CPC Code
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G06F 11/079
1
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G11C 16/26
1
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G06F 11/073
1
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G06F 11/0751
1

A system includes a memory circuitry configured to generate multiple results, each result using a different read voltage, in response to one or each received data access command. The multiple read results may be used to dynamically calibrate a read voltage assigned to generate a read result in response to a read command.

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