US Patent 11443194 Anomaly detection using a dimensional-reduction model

A method includes obtaining sensor data associated with operation of one or more devices and providing input data based on the sensor data to a dimensional-reduction model that includes a first layer having a first count of nodes, a second layer having a second count of nodes, and a third layer having a third count of nodes. The second layer is disposed between the first layer and the third layer, and the second count of nodes is greater than the first count of nodes and the third count of nodes. The method also includes determining a reconstruction error indicating a difference between the input data and the output data of the dimensional-reduction model. The method also includes performing a comparison of the reconstruction error to an anomaly detection criterion and generating an anomaly detection output for the one or more devices based on a result of the comparison.