US Patent 10242345 Automatic interview question recommendation and analysis

Described herein are methods and systems for interview question or prompt recommendation and analysis to improve the quality and efficacy of subsequent evaluation campaigns by combining data sets are described herein. In one method, processing logic selects a first prompt from a first data set of a first candidate evaluation campaign and a second prompt from a second data set of a second candidate evaluation campaign. The processing logic determines whether a degree of similarity between the first prompt and the second prompt exceeds a threshold and combines data from the first data set with data from the second data set to create a combined data set associated with the first prompt and with the second prompt based on the determination.