List of Jordan Valley Semiconductors patents

Patents where

Current Assignee

Name

Jordan Valley Semiconductors

Name	Description	Patent Applicant	Current Assignee	Patent Jurisdiction	Patent Number	Date of Patent
‌ US Patent 7406153 Control of X-ray beam spot size	Patent 7406153 was granted and assigned to Jordan Valley Semiconductors on July, 2008 by the United States Patent and Trademark Office.		Jordan Valley Semiconductors	United States Patent and Trademark Office	7406153	July 29, 2008
‌ US Patent 7453985 Control of X-ray beam spot size	Patent 7453985 was granted and assigned to Jordan Valley Semiconductors on November, 2008 by the United States Patent and Trademark Office.		Jordan Valley Semiconductors	United States Patent and Trademark Office	7453985	November 18, 2008
‌ US Patent 7680243 X-ray measurement of properties of nano-particles	Patent 7680243 was granted and assigned to Jordan Valley Semiconductors on March, 2010 by the United States Patent and Trademark Office.		Jordan Valley Semiconductors	United States Patent and Trademark Office	7680243	March 16, 2010
‌ US Patent 7415096 Curved X-ray reflector	Patent 7415096 was granted and assigned to Jordan Valley Semiconductors on August, 2008 by the United States Patent and Trademark Office.		Jordan Valley Semiconductors	United States Patent and Trademark Office	7415096	August 19, 2008
‌ US Patent 7483513 Measurement of properties of thin films on sidewalls	Patent 7483513 was granted and assigned to Jordan Valley Semiconductors on January, 2009 by the United States Patent and Trademark Office.		Jordan Valley Semiconductors	United States Patent and Trademark Office	7483513	January 27, 2009
‌ US Patent 7600916 Target alignment for X-ray scattering measurements	Patent 7600916 was granted and assigned to Jordan Valley Semiconductors on October, 2009 by the United States Patent and Trademark Office.		Jordan Valley Semiconductors	United States Patent and Trademark Office	7600916	October 13, 2009
‌ US Patent 7321652 Multi-detector EDXRD	Patent 7321652 was granted and assigned to Jordan Valley Semiconductors on January, 2008 by the United States Patent and Trademark Office.		Jordan Valley Semiconductors	United States Patent and Trademark Office	7321652	January 22, 2008
‌ US Patent 8243878 High-resolution X-ray diffraction measurement with enhanced sensitivity	Patent 8243878 was granted and assigned to Jordan Valley Semiconductors on August, 2012 by the United States Patent and Trademark Office.		Jordan Valley Semiconductors	United States Patent and Trademark Office	8243878	August 14, 2012
‌ US Patent 9269468 X-ray beam conditioning	Patent 9269468 was granted and assigned to Jordan Valley Semiconductors on February, 2016 by the United States Patent and Trademark Office.	Jordan Valley Semiconductors	Jordan Valley Semiconductors	United States Patent and Trademark Office	9269468	February 23, 2016
‌ US Patent 8687766 Enhancing accuracy of fast high-resolution X-ray diffractometry	Patent 8687766 was granted and assigned to Jordan Valley Semiconductors on April, 2014 by the United States Patent and Trademark Office.		Jordan Valley Semiconductors	United States Patent and Trademark Office	8687766	April 1, 2014
‌ US Patent 8153987 Automated calibration methodology for VUV metrology system	Patent 8153987 was granted and assigned to Jordan Valley Semiconductors on April, 2012 by the United States Patent and Trademark Office.		Jordan Valley Semiconductors	United States Patent and Trademark Office	8153987	April 10, 2012
‌ US Patent 7653174 Inspection of small features using X-ray fluorescence	Patent 7653174 was granted and assigned to Jordan Valley Semiconductors on January, 2010 by the United States Patent and Trademark Office.		Jordan Valley Semiconductors	United States Patent and Trademark Office	7653174	January 26, 2010
‌ US Patent 8781070 Detection of wafer-edge defects	Patent 8781070 was granted and assigned to Jordan Valley Semiconductors on July, 2014 by the United States Patent and Trademark Office.		Jordan Valley Semiconductors	United States Patent and Trademark Office	8781070	July 15, 2014
‌ US Patent 7649978 Automated selection of X-ray reflectometry measurement locations	Patent 7649978 was granted and assigned to Jordan Valley Semiconductors on January, 2010 by the United States Patent and Trademark Office.		Jordan Valley Semiconductors	United States Patent and Trademark Office	7649978	January 19, 2010
‌ US Patent 8014000 Broad band referencing reflectometer	Patent 8014000 was granted and assigned to Jordan Valley Semiconductors on September, 2011 by the United States Patent and Trademark Office.		Jordan Valley Semiconductors	United States Patent and Trademark Office	8014000	September 6, 2011
‌ US Patent 8054453 Broad band referencing reflectometer	Patent 8054453 was granted and assigned to Jordan Valley Semiconductors on November, 2011 by the United States Patent and Trademark Office.		Jordan Valley Semiconductors	United States Patent and Trademark Office	8054453	November 8, 2011
‌ US Patent 7804934 Accurate measurement of layer dimensions using XRF	Patent 7804934 was granted and assigned to Jordan Valley Semiconductors on September, 2010 by the United States Patent and Trademark Office.		Jordan Valley Semiconductors	United States Patent and Trademark Office	7804934	September 28, 2010
‌ US Patent 8437450 Fast measurement of X-ray diffraction from tilted layers	Patent 8437450 was granted and assigned to Jordan Valley Semiconductors on May, 2013 by the United States Patent and Trademark Office.		Jordan Valley Semiconductors	United States Patent and Trademark Office	8437450	May 7, 2013
‌ US Patent 7990549 Method and apparatus for optically measuring periodic structures using orthogonal azimuthal sample orientation	Patent 7990549 was granted and assigned to Jordan Valley Semiconductors on August, 2011 by the United States Patent and Trademark Office.		Jordan Valley Semiconductors	United States Patent and Trademark Office	7990549	August 2, 2011
‌ US Patent 7804059 Method and apparatus for accurate calibration of VUV reflectometer	Patent 7804059 was granted and assigned to Jordan Valley Semiconductors on September, 2010 by the United States Patent and Trademark Office.		Jordan Valley Semiconductors	United States Patent and Trademark Office	7804059	September 28, 2010
‌ US Patent 8119991 Method and apparatus for accurate calibration of VUV reflectometer	Patent 8119991 was granted and assigned to Jordan Valley Semiconductors on February, 2012 by the United States Patent and Trademark Office.		Jordan Valley Semiconductors	United States Patent and Trademark Office	8119991	February 21, 2012
‌ US Patent 7948631 Method and apparatus for using multiple relative reflectance measurements to determine properties of a sample using vacuum ultra violet wavelengths	Patent 7948631 was granted and assigned to Jordan Valley Semiconductors on May, 2011 by the United States Patent and Trademark Office.		Jordan Valley Semiconductors	United States Patent and Trademark Office	7948631	May 24, 2011
‌ US Patent 8565379 Combining X-ray and VUV analysis of thin film layers			Jordan Valley Semiconductors	United States Patent and Trademark Office	8565379	October 22, 2013
‌ US Patent 8564780 Method and system for using reflectometry below deep ultra-violet (DUV) wavelengths for measuring properties of diffracting or scattering structures on substrate work pieces			Jordan Valley Semiconductors	United States Patent and Trademark Office	8564780	October 22, 2013

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