Is a
Patent attributes
Current Assignee
Patent Jurisdiction
Patent Number
Patent Inventor Names
Alex Tokar0
Boris Yokhin0
Alexander Krokhmal0
Date of Patent
January 22, 2008
0Patent Application Number
115321620
Date Filed
September 15, 2006
0Patent Primary Examiner
Patent abstract
A method for analysis of a sample includes irradiating an area of the sample with a polychromatic X-ray beam. X-rays scattered from the sample are detected using a plurality of detectors simultaneously in different, respective positions, whereby the detectors generate respective outputs. Energy-dispersive processing is applied to the outputs of the detectors so as to identify one or more X-ray diffraction lines of the sample.
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