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US Patent 8781070 Detection of wafer-edge defects

Patent 8781070 was granted and assigned to Jordan Valley Semiconductors on July, 2014 by the United States Patent and Trademark Office.

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Patent Inventor Names

Paul Ryan0

John Leonard Wall0

Matthew Wormington0

Date of Patent

July 15, 2014

Patent Application Number

135702710

Date Filed

August 9, 2012

Patent Primary Examiner

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