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List of Sciaky, Inc. patents

List of Sciaky, Inc. patents

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Patents where

Current Assignee

Name

is

Sciaky, Inc.

	Name	Description	Patent Applicant	Current Assignee	Inventor	Patent Jurisdiction	Patent Number	Date of Patent
	‌ US Patent 9399264 Electron beam layer manufacturing	Patent 9399264 was granted and assigned to Sciaky, Inc. on July, 2016 by the United States Patent and Trademark Office.	Sciaky, Inc.	Sciaky, Inc.		United States Patent and Trademark Office	9399264	July 26, 2016
	‌ US Patent 10189114 Electron beam layer manufacturing	Patent 10189114 was granted and assigned to Sciaky, Inc. on January, 2019 by the United States Patent and Trademark Office.	Sciaky, Inc.	Sciaky, Inc.		United States Patent and Trademark Office	10189114	January 29, 2019
	‌ US Patent 11344967 Electron beam layer manufacturing	Patent 11344967 was granted and assigned to Sciaky, Inc. on May, 2022 by the United States Patent and Trademark Office.	Sciaky, Inc.	Sciaky, Inc.		United States Patent and Trademark Office	11344967	May 31, 2022
	‌ US Patent 8546717 Electron beam layer manufacturing	Patent 8546717 was granted and assigned to Sciaky, Inc. on October, 2013 by the United States Patent and Trademark Office.		Sciaky, Inc.		United States Patent and Trademark Office	8546717	October 1, 2013
	‌ US Patent 8809780 Electron beam layer manufacturing using scanning electron monitored closed loop control	Patent 8809780 was granted and assigned to Sciaky, Inc. on August, 2014 by the United States Patent and Trademark Office.	Sciaky, Inc.	Sciaky, Inc.		United States Patent and Trademark Office	8809780	August 19, 2014
	‌ US Patent 8598523 Electron beam layer manufacturing using scanning electron monitored closed loop control	Patent 8598523 was granted and assigned to Sciaky, Inc. on December, 2013 by the United States Patent and Trademark Office.		Sciaky, Inc.		United States Patent and Trademark Office	8598523	December 3, 2013
	‌ US Patent 10071437 Raster methodology, apparatus and system for electron beam layer manufacturing using closed loop control	Patent 10071437 was granted and assigned to Sciaky, Inc. on September, 2018 by the United States Patent and Trademark Office.	Sciaky, Inc.	Sciaky, Inc.		United States Patent and Trademark Office	10071437	September 11, 2018
	‌ US Patent 10946474 Raster methodology, apparatus and system for electron beam layer manufacturing using closed loop control	Patent 10946474 was granted and assigned to Sciaky, Inc. on March, 2021 by the United States Patent and Trademark Office.	Sciaky, Inc.	Sciaky, Inc.		United States Patent and Trademark Office	10946474	March 16, 2021
	‌ US Patent 9174300 Raster methodology, apparatus and system for electron beam layer manufacturing using closed loop control	Patent 9174300 was granted and assigned to Sciaky, Inc. on November, 2015 by the United States Patent and Trademark Office.	Sciaky, Inc.	Sciaky, Inc.		United States Patent and Trademark Office	9174300	November 3, 2015
	‌ US Patent 8461474 Raster methodology, apparatus and system for electron beam layer manufacturing using closed loop control	Patent 8461474 was granted and assigned to Sciaky, Inc. on June, 2013 by the United States Patent and Trademark Office.		Sciaky, Inc.		United States Patent and Trademark Office	8461474	June 11, 2013

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