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US Patent 10189114 Electron beam layer manufacturing

Patent 10189114 was granted and assigned to Sciaky, Inc. on January, 2019 by the United States Patent and Trademark Office.

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Contents

Is a
Patent
Patent

Patent attributes

Patent Applicant
Sciaky, Inc.
Sciaky, Inc.
Current Assignee
Sciaky, Inc.
Sciaky, Inc.
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
10189114
Date of Patent
January 29, 2019
Patent Application Number
15180665
Date Filed
June 13, 2016
Patent Citations
‌
US Patent 10071437 Raster methodology, apparatus and system for electron beam layer manufacturing using closed loop control
Patent Citations Received
‌
US Patent 12115596 Methods for site-specific enhancement of soft magnetic alloys
0
‌
US Patent 11541457 Devices, systems, and methods for monitoring a powder layer in additive manufacturing processes
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US Patent 11338519 Devices, systems, and methods for monitoring a powder layer in additive manufacturing processes
‌
US Patent 11858842 Optical fiber bending mechanisms
0
Patent Primary Examiner
‌
Samuel M. Heinrich
Patent abstract

A process and apparatus for free form fabrication of a three-dimensional work piece comprising (a) feeding raw material in a solid state to a first predetermined location; (b) depositing the raw material onto a substrate as a molten pool deposit under a first processing condition; (c) monitoring the molten pool deposit for a preselected condition; (d) comparing information about the preselected condition of the monitored molten pool deposit with a predetermined desired value for the preselected condition of the monitored molten pool deposit; (e) solidifying the molten pool deposit; (f) automatically altering the first processing condition to a different processing condition based upon information obtained from the comparing step (d); and repeating steps (a) through (f) at one or more second locations for building up layer by layer a three-dimensional work piece. The apparatus is characterized by a detector that monitors a preselected condition of the deposited material and a closed loop electronic control device for controlling operation of one or more components of the apparatus in response to a detected condition by the detector.

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