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US Patent 8809780 Electron beam layer manufacturing using scanning electron monitored closed loop control

Patent 8809780 was granted and assigned to Sciaky, Inc. on August, 2014 by the United States Patent and Trademark Office.

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Patent

Patent attributes

Patent Applicant

Sciaky, Inc.

Current Assignee

Sciaky, Inc.

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

88097800

Patent Inventor Names

Phillip E. Wollenhaupt0

Scott Stecker0

Date of Patent

August 19, 2014

Patent Application Number

140789100

Date Filed

November 13, 2013

Patent Citations Received

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US Patent 12122120 Additive manufacturing processes and additively manufactured products

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US Patent 11858042 Open loop parameter optimization for additive manufacturing

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US Patent 11860601 Calibration of a computer-numerically-controlled machine

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US Patent 11860606 Fabrication with image tracing

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US Patent 11880182 Safety and reliability for laser fabrication

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US Patent 11995159 Multi-function computer numerically controlled machine

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US Patent 11770906 3D-printed ceramics with conductor infusion for ultra-high-speed electronics

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US Patent 11835936 Multi-user computer-numerically-controlled machine

Patent Primary Examiner

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Jack Berman

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