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US Patent 8809780 Electron beam layer manufacturing using scanning electron monitored closed loop control

Patent 8809780 was granted and assigned to Sciaky, Inc. on August, 2014 by the United States Patent and Trademark Office.

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Patent
Patent
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Patent attributes

Patent Applicant
Sciaky, Inc.
Sciaky, Inc.
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Current Assignee
Sciaky, Inc.
Sciaky, Inc.
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
88097800
Patent Inventor Names
Phillip E. Wollenhaupt0
Scott Stecker0
Date of Patent
August 19, 2014
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Patent Application Number
140789100
Date Filed
November 13, 2013
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Patent Citations Received
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US Patent 12122120 Additive manufacturing processes and additively manufactured products
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US Patent 11858042 Open loop parameter optimization for additive manufacturing
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US Patent 11860601 Calibration of a computer-numerically-controlled machine
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US Patent 11860606 Fabrication with image tracing
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US Patent 11880182 Safety and reliability for laser fabrication
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US Patent 11995159 Multi-function computer numerically controlled machine
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US Patent 11770906 3D-printed ceramics with conductor infusion for ultra-high-speed electronics
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US Patent 11835936 Multi-user computer-numerically-controlled machine
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Patent Primary Examiner
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Jack Berman
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